RHK Technology - March 2010 IOM Coffee Mug
Kelvin Probe Measurement on graphene exfoliated on SrTiO3 (Strontium titanate) obtained in non-contact AFM mode using a frequency shift of -5 Hz. The graphene was irradiated with Xenon 23+ ions under grazing incidence of 6°. On monolayer the impact of the ions lead to characteristic folding. In Bias-Image the exposed underlying substrate in this area can be clearly seen.
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 obtained in non-contact AFM mode using a frequency shift of -5 Hz. The graphene was irradiated with Xenon 23+ ions under grazing incidence of 6°. On monolayer the impact of the ions lead to characteristic folding. In Bias-Image the exposed underlying substrate in this area can be clearly seen.){kind=spacer}
